A Novel Attribute-based Symmetric Multiple Instance Learning for Histopathological Image Analysis

Published in IEEE Transactions on Medical Imaging, 2020

Recommended citation: Trung Vu, Phung Lai, Raviv Raich, Anh Pham, Xiaoli Z. Fern and UK Arvind Rao. "Local A Novel Attribute-based Symmetric Multiple Instance Learning for Histopathological Image Analysis," IEEE Transactions on Medical Imaging. https://ieeexplore.ieee.org/document/9067062